John H. Cantrell, Sean A. Cantrell Profile
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Nonlinear Dynamics of Cantilever Tip-Sample Surface Interactions in Atomic Force Microscopy Technology by John H. Cantrell, Sean A. CantrellNonlinear Dynamics of Cantilever Tip-Sample Surface Interactions in Atomic Force Microscopy
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19Pages:
31Published:
Nov 2013A study on Cantilever Tip-Sample Surface using a Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning ...
Formats: PDF